Influence of surface topology on the electrical response of many bead assemblies
We propose an interpretation of the voltage creep observed in metallic grain assemblies based on the sensitivity of the electrical properties to the surface topology of the beads. From the real area of contact between adjacent beads, directly measured through the bulk resistance of a single bead, we...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2012-09-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/1.4738952 |