Intensity-based laser distance measurement system using 2D electromagnetic scanning micromirror
Abstract In this research, we present the feasibility testing results of a simple distance measurement system using microfabricated scanning micromirrors. Two different configurations have been tested with different types of micromirrors. In the first configuration, Lissajous scan pattern has been g...
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2018-11-01
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Series: | Micro and Nano Systems Letters |
Online Access: | http://link.springer.com/article/10.1186/s40486-018-0073-2 |
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doaj-eb771532ef534bdea87d8f2e2619a7972020-11-25T01:49:10ZengSpringerOpenMicro and Nano Systems Letters2213-96212018-11-01611710.1186/s40486-018-0073-2Intensity-based laser distance measurement system using 2D electromagnetic scanning micromirrorKyoungeun Kim0Jungyeon Hwang1Chang-Hyeon Ji2Department of Electronic and Electrical Engineering, Ewha Womans UniversityDepartment of Electronic and Electrical Engineering, Ewha Womans UniversityDepartment of Electronic and Electrical Engineering, Ewha Womans UniversityAbstract In this research, we present the feasibility testing results of a simple distance measurement system using microfabricated scanning micromirrors. Two different configurations have been tested with different types of micromirrors. In the first configuration, Lissajous scan pattern has been generated with horizontal scan frequency of 715 Hz, and the intensity of the laser beam reflected from the object has been measured with avalanche photodiode to estimate the distance. The position of the beam has been tracked using a separate position sensitive detector. Signals from both sensors are synchronized by eliminating the signal delay, which enables the detection of the distance of a specific point in the 2-dimensional scan pattern. In the simplified configuration, faster scanning micromirror with horizontal scan frequency of 28.8 kHz has been used to increase the resolution and position sensitive detector has been removed from the system by synchronizing the driving current waveform with the avalanche photodiode signals. Distance measurement from 20 to 50 cm has been demonstrated with the developed system.http://link.springer.com/article/10.1186/s40486-018-0073-2 |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Kyoungeun Kim Jungyeon Hwang Chang-Hyeon Ji |
spellingShingle |
Kyoungeun Kim Jungyeon Hwang Chang-Hyeon Ji Intensity-based laser distance measurement system using 2D electromagnetic scanning micromirror Micro and Nano Systems Letters |
author_facet |
Kyoungeun Kim Jungyeon Hwang Chang-Hyeon Ji |
author_sort |
Kyoungeun Kim |
title |
Intensity-based laser distance measurement system using 2D electromagnetic scanning micromirror |
title_short |
Intensity-based laser distance measurement system using 2D electromagnetic scanning micromirror |
title_full |
Intensity-based laser distance measurement system using 2D electromagnetic scanning micromirror |
title_fullStr |
Intensity-based laser distance measurement system using 2D electromagnetic scanning micromirror |
title_full_unstemmed |
Intensity-based laser distance measurement system using 2D electromagnetic scanning micromirror |
title_sort |
intensity-based laser distance measurement system using 2d electromagnetic scanning micromirror |
publisher |
SpringerOpen |
series |
Micro and Nano Systems Letters |
issn |
2213-9621 |
publishDate |
2018-11-01 |
description |
Abstract In this research, we present the feasibility testing results of a simple distance measurement system using microfabricated scanning micromirrors. Two different configurations have been tested with different types of micromirrors. In the first configuration, Lissajous scan pattern has been generated with horizontal scan frequency of 715 Hz, and the intensity of the laser beam reflected from the object has been measured with avalanche photodiode to estimate the distance. The position of the beam has been tracked using a separate position sensitive detector. Signals from both sensors are synchronized by eliminating the signal delay, which enables the detection of the distance of a specific point in the 2-dimensional scan pattern. In the simplified configuration, faster scanning micromirror with horizontal scan frequency of 28.8 kHz has been used to increase the resolution and position sensitive detector has been removed from the system by synchronizing the driving current waveform with the avalanche photodiode signals. Distance measurement from 20 to 50 cm has been demonstrated with the developed system. |
url |
http://link.springer.com/article/10.1186/s40486-018-0073-2 |
work_keys_str_mv |
AT kyoungeunkim intensitybasedlaserdistancemeasurementsystemusing2delectromagneticscanningmicromirror AT jungyeonhwang intensitybasedlaserdistancemeasurementsystemusing2delectromagneticscanningmicromirror AT changhyeonji intensitybasedlaserdistancemeasurementsystemusing2delectromagneticscanningmicromirror |
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1725008324212031488 |