Accuracy of genomic selection for grain yield and agronomic traits in soft red winter wheat

Accuracy of genomic selection for grain yield and agronomic traits in soft red winter wheat

Abstract Background Genomic selection has the potential to increase genetic gains by using molecular markers as predictors of breeding values of individuals. This study evaluated the accuracy of predictions for grain yield, heading date, plant height, and yield components in soft red winter wheat un...

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Bibliographic Details
Main Authors: Dennis N. Lozada, R. Esten Mason, Jose Martin Sarinelli, Gina Brown-Guedira
Format: Article
Language:English
Published: BMC 2019-11-01
Series:BMC Genetics
Subjects:
Agronomic traits
Genomic selection
Grain yield
Ridge regression best linear unbiased prediction
Soft red winter wheat
Yield components
Online Access:http://link.springer.com/article/10.1186/s12863-019-0785-1

Internet

http://link.springer.com/article/10.1186/s12863-019-0785-1

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