Advanced Modelling Techniques for Resonator Based Dielectric and Semiconductor Materials Characterization

• Main Authors: Arif Can Gungor, Marzena Olszewska-Placha, Malgorzata Celuch, Jasmin Smajic, Juerg Leuthold
• Format: Article
• Language: English
• Published: MDPI AG 2020-11-01
• Series: Applied Sciences
• Subjects: materials modelling; materials characterization; scanning microwave microscopy; dielectric resonators; electromagnetic modelling; semiconductor modelling
• Online Access: https://www.mdpi.com/2076-3417/10/23/8533

This article reports recent developments in modelling based on Finite Difference Time Domain (FDTD) and Finite Element Method (FEM) for dielectric resonator material measurement setups. In contrast to the methods of the dielectric resonator design, where analytical expansion into Bessel functions is used to solve the Maxwell equations, here the analytical information is used only to ensure the fixed angular variation of the fields, while in the longitudinal and radial direction space discretization is applied, that reduced the problem to 2D. Moreover, when the discretization is performed in time domain, full-wave electromagnetic solvers can be directly coupled to semiconductor drift-diffusion solvers to better understand and predict the behavior of the resonator with semiconductor-based samples. Herein, FDTD and frequency domain FEM approaches are applied to the modelling of dielectric samples and validated against the measurements within the 0.3% margin dictated by the IEC norm. Then a coupled in-house developed multiphysics time-domain FEM solver is employed in order to take the local conductivity changes under electromagnetic illumination into account. New methodologies are thereby demonstrated that open the way to new applications of the dielectric resonator measurements.