Advanced Modelling Techniques for Resonator Based Dielectric and Semiconductor Materials Characterization

Advanced Modelling Techniques for Resonator Based Dielectric and Semiconductor Materials Characterization

This article reports recent developments in modelling based on Finite Difference Time Domain (FDTD) and Finite Element Method (FEM) for dielectric resonator material measurement setups. In contrast to the methods of the dielectric resonator design, where analytical expansion into Bessel functions is...

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Bibliographic Details
Main Authors: Arif Can Gungor, Marzena Olszewska-Placha, Malgorzata Celuch, Jasmin Smajic, Juerg Leuthold
Format: Article
Language:English
Published: MDPI AG 2020-11-01
Series:Applied Sciences
Subjects:
materials modelling
materials characterization
scanning microwave microscopy
dielectric resonators
electromagnetic modelling
semiconductor modelling
Online Access:https://www.mdpi.com/2076-3417/10/23/8533

Internet

https://www.mdpi.com/2076-3417/10/23/8533

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