On-Wafer Measurements for Extraction of Effective Dielectric Constant in IC Transmission Lines on Multilayer Substrates
Methodology for extracting an effective dielectric constant of microstrip transmission lines on multilayer substrates, from measured or simulated S-parameters data, using on-chip test structures, has been demonstrated. The methodology consists of: 1) building on-chip interconnect structures usually...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
Telecommunications Society, Academic Mind
2012-11-01
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| Series: | Telfor Journal |
| Subjects: | |
| Online Access: | http://journal.telfor.rs/Published/Vol4No2/Vol4No2_A12.pdf |