On-Wafer Measurements for Extraction of Effective Dielectric Constant in IC Transmission Lines on Multilayer Substrates

Methodology for extracting an effective dielectric constant of microstrip transmission lines on multilayer substrates, from measured or simulated S-parameters data, using on-chip test structures, has been demonstrated. The methodology consists of: 1) building on-chip interconnect structures usually...

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Bibliographic Details
Main Authors: R. B. Borisov, R. G. Arnaudov
Format: Article
Language:English
Published: Telecommunications Society, Academic Mind 2012-11-01
Series:Telfor Journal
Subjects:
Online Access:http://journal.telfor.rs/Published/Vol4No2/Vol4No2_A12.pdf