Optical and Magnetooptical Spectroscopy of the Nanostructural Multilayered Films: Possible Applications

The aim of the paper is to show the potential of the spectroscopic ellipsometry and magnetooptical (MO) spectroscopy for probing of the multilayered films (MLF) with sublayer thickness of about a few nanometres. The main approach applied by us is based on the comparison of the experimental optical a...

Full description

Bibliographic Details
Main Author: Yu. V. Kudryavtsev, V. M. Uvarov, R. Gontarz, J. Dubowik, Y. P. Lee, J. Y. Rhee, Yu. N. Makogon, E. P. Pavlova
Format: Article
Language:English
Published: G. V. Kurdyumov Institute for Metal Physics of the N.A.S. of Ukraine 2005-06-01
Series:Успехи физики металлов
Online Access:https://doi.org/10.15407/ufm.06.02.135

Similar Items