Optical and Magnetooptical Spectroscopy of the Nanostructural Multilayered Films: Possible Applications
The aim of the paper is to show the potential of the spectroscopic ellipsometry and magnetooptical (MO) spectroscopy for probing of the multilayered films (MLF) with sublayer thickness of about a few nanometres. The main approach applied by us is based on the comparison of the experimental optical a...
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| Format: | Article |
| Language: | English |
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G. V. Kurdyumov Institute for Metal Physics of the N.A.S. of Ukraine
2005-06-01
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| Series: | Успехи физики металлов |
| Online Access: | https://doi.org/10.15407/ufm.06.02.135 |