Exploring TanDEM-X Interferometric Products for Crop-Type Mapping
The application of satellite single-pass interferometric data to crop-type mapping is demonstrated for the first time in this work. A set of nine TanDEM-X dual-pol pairs of images acquired during its science phase, from June to August 2015, is exploited for this purpose. An agricultural site located...
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2020-06-01
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| Series: | Remote Sensing |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2072-4292/12/11/1774 |