Design of a Highly Robust Triple-Node-Upset Self-Recoverable Latch
Due to semiconductor technology scaling, integrated circuits have become more sensitive to soft errors. To effectively tolerate multi-node-upsets caused by soft errors and reduce the power dissipation and delay of a latch, this paper proposes a novel triple-node-upset (TNU) self-recoverable latch de...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2021-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/9512035/ |