A Low-Power High-Speed Dynamic Comparator With a Transconductance-Enhanced Latching Stage

Low-power, high-speed dynamic comparators are highly desirable in the design of high-speed analog-to-digital converters (ADC) and digital I/O circuits. Most dynamic comparators use a pair of cross-coupled inverters as the latching stage, which provides strong positive feedback, to accelerate the com...

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Main Authors: Yao Wang, Mengmeng Yao, Benqing Guo, Zhaolei Wu, Wenbing Fan, Juin Jei Liou
Format: Article
Language:English
Published: IEEE 2019-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/8758098/
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spelling doaj-e7a77dca99464509a314890ebbbc18f22021-03-29T23:30:56ZengIEEEIEEE Access2169-35362019-01-017933969340310.1109/ACCESS.2019.29275148758098A Low-Power High-Speed Dynamic Comparator With a Transconductance-Enhanced Latching StageYao Wang0https://orcid.org/0000-0002-4841-4232Mengmeng Yao1Benqing Guo2Zhaolei Wu3Wenbing Fan4Juin Jei Liou5School of Information Engineering, Zhengzhou University, Zhengzhou, ChinaSchool of Information Engineering, Zhengzhou University, Zhengzhou, ChinaCollege of Communication Engineering, Chengdu University of Information Technology, Chengdu, ChinaNaneng Microelectronics Company Ltd., Chengdu, ChinaSchool of Information Engineering, Zhengzhou University, Zhengzhou, ChinaSchool of Information Engineering, Zhengzhou University, Zhengzhou, ChinaLow-power, high-speed dynamic comparators are highly desirable in the design of high-speed analog-to-digital converters (ADC) and digital I/O circuits. Most dynamic comparators use a pair of cross-coupled inverters as the latching stage, which provides strong positive feedback, to accelerate the comparison and reduce the static power consumption. The delay of the comparator is mainly determined by the total effective transconductance of the latching stage. The delay not only limits the maximum operating frequency but also extends the period of the metastable state of the latching stage; hence, it increases energy consumption. However, at the beginning of the comparison phase, the conventional latching stage has two transistors with zero gate-to-source voltage, which degrade the total effective transconductance of the latching stage. In this paper, a novel low-power, high-speed dynamic comparator with a new latching stage is presented. The proposed latching stage uses separated gate-biasing cross-coupled transistors instead of the conventional cross-coupled inverter structure. The simple proposed latching stage improves its effective total transconductance at the beginning of the comparison phase, which leads to a much faster comparison and lowers energy consumption. The comparator is analyzed and compared to its prior type in terms of delay and power consumption via simulations and measurements. The experimental results demonstrate that the proposed comparator operates from a 1.2-V supply and consumes 110-fJ energy per comparison, with sampling speeds up to 2 GS/s.https://ieeexplore.ieee.org/document/8758098/Dynamic comparatorhigh-speedlow-powertwo-stage comparator
collection DOAJ
language English
format Article
sources DOAJ
author Yao Wang
Mengmeng Yao
Benqing Guo
Zhaolei Wu
Wenbing Fan
Juin Jei Liou
spellingShingle Yao Wang
Mengmeng Yao
Benqing Guo
Zhaolei Wu
Wenbing Fan
Juin Jei Liou
A Low-Power High-Speed Dynamic Comparator With a Transconductance-Enhanced Latching Stage
IEEE Access
Dynamic comparator
high-speed
low-power
two-stage comparator
author_facet Yao Wang
Mengmeng Yao
Benqing Guo
Zhaolei Wu
Wenbing Fan
Juin Jei Liou
author_sort Yao Wang
title A Low-Power High-Speed Dynamic Comparator With a Transconductance-Enhanced Latching Stage
title_short A Low-Power High-Speed Dynamic Comparator With a Transconductance-Enhanced Latching Stage
title_full A Low-Power High-Speed Dynamic Comparator With a Transconductance-Enhanced Latching Stage
title_fullStr A Low-Power High-Speed Dynamic Comparator With a Transconductance-Enhanced Latching Stage
title_full_unstemmed A Low-Power High-Speed Dynamic Comparator With a Transconductance-Enhanced Latching Stage
title_sort low-power high-speed dynamic comparator with a transconductance-enhanced latching stage
publisher IEEE
series IEEE Access
issn 2169-3536
publishDate 2019-01-01
description Low-power, high-speed dynamic comparators are highly desirable in the design of high-speed analog-to-digital converters (ADC) and digital I/O circuits. Most dynamic comparators use a pair of cross-coupled inverters as the latching stage, which provides strong positive feedback, to accelerate the comparison and reduce the static power consumption. The delay of the comparator is mainly determined by the total effective transconductance of the latching stage. The delay not only limits the maximum operating frequency but also extends the period of the metastable state of the latching stage; hence, it increases energy consumption. However, at the beginning of the comparison phase, the conventional latching stage has two transistors with zero gate-to-source voltage, which degrade the total effective transconductance of the latching stage. In this paper, a novel low-power, high-speed dynamic comparator with a new latching stage is presented. The proposed latching stage uses separated gate-biasing cross-coupled transistors instead of the conventional cross-coupled inverter structure. The simple proposed latching stage improves its effective total transconductance at the beginning of the comparison phase, which leads to a much faster comparison and lowers energy consumption. The comparator is analyzed and compared to its prior type in terms of delay and power consumption via simulations and measurements. The experimental results demonstrate that the proposed comparator operates from a 1.2-V supply and consumes 110-fJ energy per comparison, with sampling speeds up to 2 GS/s.
topic Dynamic comparator
high-speed
low-power
two-stage comparator
url https://ieeexplore.ieee.org/document/8758098/
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