Combined study of evaporation from liquid surface by background oriented schlieren, infrared thermal imaging and numerical simulation
Temperature fields in evaporating liquids are measured by simultaneous use of Background Oriented Schlieren (BOS) technique for the side view and IR thermal imaging for the surface distribution. Good agreement between the two methods is obtained with typical measurement error less than 0.1 K. Two co...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
EDP Sciences
2013-04-01
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| Series: | EPJ Web of Conferences |
| Online Access: | http://dx.doi.org/10.1051/epjconf/20134501093 |