One electron-controlled multiple-valued dynamic random-access-memory

We propose a new architecture for a dynamic random-access-memory (DRAM) capable of storing multiple values by using a single-electron transistor (SET). The gate of a SET is designed to be connected to a plurality of DRAM unit cells that are arrayed at intersections of word lines and bitlines. In thi...

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Bibliographic Details
Main Authors: H. W. Kye, B. N. Song, S. E. Lee, J. S. Kim, S. J. Shin, J. B. Choi, Y.-S. Yu, Y. Takahashi
Format: Article
Language:English
Published: AIP Publishing LLC 2016-02-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/1.4942901