QTL for spike-layer uniformity and their influence on yield-related traits in wheat
Abstract Background Common wheat (Triticum aestivum L.) is one of the most important food crops worldwide. Wheat spike-layer uniformity related traits (SLURTs) were complex traits that directly affect yield potential and appearance. In this study, quantitative trait locus (QTL) for five SLURTs among...
Main Authors: | , , , , , , , , , |
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Format: | Article |
Language: | English |
Published: |
BMC
2019-02-01
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Series: | BMC Genetics |
Subjects: | |
Online Access: | http://link.springer.com/article/10.1186/s12863-019-0730-3 |