Frequency Function in Atomic Force Microscopy Applied to a Liquid Environment
Scanning specimens in liquids using commercial atomic force microscopy (AFM) is very time-consuming due to the necessary try-and-error iteration for determining appropriate triggering frequencies and probes. In addition, the iteration easily contaminates the AFM tip and damages the samples, which co...
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| Format: | Article |
| Language: | English |
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MDPI AG
2014-05-01
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| Series: | Sensors |
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| Online Access: | http://www.mdpi.com/1424-8220/14/6/9369 |