Contribution of internal ionization processes in semiconductors to radiative losses of relativistic electrons
The study presents analysis of mass radiative energy losses (RL) incurred by relativistic electrons in different materials commonly used in semiconductor electronics. We have specifically focused on accounting for the processes of 'internal' ionization, resulting in the production of elect...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Peter the Great St.Petersburg Polytechnic University
2020-09-01
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| Series: | St. Petersburg Polytechnical University Journal: Physics and Mathematics |
| Subjects: | |
| Online Access: | https://physmath.spbstu.ru/article/2020.49.01/ |