Robust procedure for creating and characterizing the atomic structure of scanning tunneling microscope tips

Scanning tunneling microscopes (STM) are used extensively for studying and manipulating matter at the atomic scale. In spite of the critical role of the STM tip, procedures for controlling the atomic-scale shape of STM tips have not been rigorously justified. Here, we present a method for preparing...

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Bibliographic Details
Main Authors: Sumit Tewari, Koen M. Bastiaans, Milan P. Allan, Jan M. van Ruitenbeek
Format: Article
Language:English
Published: Beilstein-Institut 2017-11-01
Series:Beilstein Journal of Nanotechnology
Subjects:
Online Access:https://doi.org/10.3762/bjnano.8.238