Corn Response to Climate Stress Detected with Satellite-Based NDVI Time Series

Corn growth conditions and yield are closely dependent on climate variability. Leaf growth, measured as the leaf area index, can be used to identify changes in crop growth in response to climate stress. This research was conducted to capture patterns of spatial and temporal corn leaf growth under cl...

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Bibliographic Details
Main Authors: Ruoyu Wang, Keith Cherkauer, Laura Bowling
Format: Article
Language:English
Published: MDPI AG 2016-03-01
Series:Remote Sensing
Subjects:
Online Access:http://www.mdpi.com/2072-4292/8/4/269