Growth and characterization of CuxO (x=1, 2) nanocrystalline layers grown on silicon obtained by thermal copper oxidation

$\mathrm{CuO}$ and $\mathrm{Cu}_2\mathrm{O}$ layers of nanometric thicknesses on monocrystalline silicon were grown by thermal oxidation technique. The $\mathrm{Cu}_2\mathrm{O}$ layers were obtained at a temperature of $200^oC$, whereas for the phase of the $\mathrm{CuO}$ was necessary to use a high...

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Bibliographic Details
Main Authors: José Eladio Flores-Mena, Roberto Saul Castillo-Ojeda, Joel Diaz-Reyes
Format: Article
Language:English
Published: Universidad Autonoma de Yucatan 2014-12-01
Series:Mexican Journal of Materials Science and Engineering
Subjects:
AFM
XRD
Online Access:http://intranet.matematicas.uady.mx/mjmatse/volumenes/volumen1/3/MJMATSE_1_3_46.pdf