Electrical Driven Light Emitting From a Tunneling Junction With Negative Resistance Effect

Electrical Driven Light Emitting From a Tunneling Junction With Negative Resistance Effect

We investigate the electrical and optical performance of surface-plasmon-mediated light emission in electrical-driven metal-insulator-metal (MIM) tunnel junctions fabricated from a gold (Au) film on the top and a heavily doped silicon chip on the bottom. A silicon dioxide layer is used as the tunnel...

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Bibliographic Details
Main Authors: Chi Li, Zhenjun Li, Ke Chen, Bing Bai, Qing Dai
Format: Article
Language:English
Published: IEEE 2017-01-01
Series:IEEE Journal of the Electron Devices Society
Subjects:
Metal-insulator-metal
surface plasmon
inelastic tunneling
light emitting
negative resistance effect field
Online Access:https://ieeexplore.ieee.org/document/7915688/

Internet

https://ieeexplore.ieee.org/document/7915688/

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