A scanning tunneling microscopy based potentiometry technique and its application to the local sensing of the spin Hall effect

A scanning tunneling microscopy based potentiometry technique for the measurements of the local surface electric potential is presented. A voltage compensation circuit based on this potentiometry technique is developed and employed to maintain a desired tunneling voltage independent of the bias curr...

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Bibliographic Details
Main Authors: Ting Xie, Michael Dreyer, David Bowen, Dan Hinkel, R. E. Butera, Charles Krafft, Isaak Mayergoyz
Format: Article
Language:English
Published: AIP Publishing LLC 2017-12-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/1.4991916