Intelligent Manufacturing: TCAD-Assisted Adaptive Weighting Neural Networks

Intelligent Manufacturing: TCAD-Assisted Adaptive Weighting Neural Networks

Using machine intelligence on device and process performance prediction is an emerging methodology in the IC industry. While semiconductor technology computer-aided design (TCAD) has been researched and developed for over 30 years, it should contribute to or be used in conjunction with machine learn...

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Bibliographic Details
Main Authors: Chien Y. Huang, Sze M. Fu, Parag Parashar, Chun H. Chen, Chandni Akbar, Albert S. Lin
Format: Article
Language:English
Published: IEEE 2018-01-01
Series:IEEE Access
Subjects:
Machine learning algorithms
artificial neural networks
semiconductor device manufacture
semiconductor process modeling
Online Access:https://ieeexplore.ieee.org/document/8558525/

Internet

https://ieeexplore.ieee.org/document/8558525/

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