Nonstoichiometry in TiO2−y Studied by Ion Beam Methods and Photoelectron Spectroscopy
This paper treats a problem of nonstoichiometry in TiO2−y thin films deposited by reactive sputtering at controlled sputtering rates. Ion beam techniques, Rutherford backscattering (RBS), and nuclear reaction analysis (NRA) along with X-ray photoelectron spectroscopy have been applied to determine a...
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2012-01-01
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Series: | Advances in Materials Science and Engineering |
Online Access: | http://dx.doi.org/10.1155/2012/826873 |
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doaj-d7410ba5fcb44653b1b2c7ef5659b1bc2020-11-24T23:00:04ZengHindawi LimitedAdvances in Materials Science and Engineering1687-84341687-84422012-01-01201210.1155/2012/826873826873Nonstoichiometry in TiO2−y Studied by Ion Beam Methods and Photoelectron SpectroscopyK. Zakrzewska0Faculty of Electrical Engineering, Automatics, Computer Science and Electronics, AGH University of Science and Technology, 30 Mickiewicza Avenue, 30-059 Kraków, PolandThis paper treats a problem of nonstoichiometry in TiO2−y thin films deposited by reactive sputtering at controlled sputtering rates. Ion beam techniques, Rutherford backscattering (RBS), and nuclear reaction analysis (NRA) along with X-ray photoelectron spectroscopy have been applied to determine a deviation from stoichiometry y in the bulk and at the surface of TiO2−y layers. The critical review of these experimental methods is given. Defect structure responsible for the electrical resistivity of rutile TiO2 is discussed.http://dx.doi.org/10.1155/2012/826873 |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
K. Zakrzewska |
spellingShingle |
K. Zakrzewska Nonstoichiometry in TiO2−y Studied by Ion Beam Methods and Photoelectron Spectroscopy Advances in Materials Science and Engineering |
author_facet |
K. Zakrzewska |
author_sort |
K. Zakrzewska |
title |
Nonstoichiometry in TiO2−y Studied by Ion Beam Methods and Photoelectron Spectroscopy |
title_short |
Nonstoichiometry in TiO2−y Studied by Ion Beam Methods and Photoelectron Spectroscopy |
title_full |
Nonstoichiometry in TiO2−y Studied by Ion Beam Methods and Photoelectron Spectroscopy |
title_fullStr |
Nonstoichiometry in TiO2−y Studied by Ion Beam Methods and Photoelectron Spectroscopy |
title_full_unstemmed |
Nonstoichiometry in TiO2−y Studied by Ion Beam Methods and Photoelectron Spectroscopy |
title_sort |
nonstoichiometry in tio2−y studied by ion beam methods and photoelectron spectroscopy |
publisher |
Hindawi Limited |
series |
Advances in Materials Science and Engineering |
issn |
1687-8434 1687-8442 |
publishDate |
2012-01-01 |
description |
This paper treats a problem of nonstoichiometry in TiO2−y thin films deposited by reactive sputtering at controlled sputtering rates. Ion beam techniques, Rutherford backscattering (RBS), and nuclear reaction analysis (NRA) along with X-ray photoelectron spectroscopy have been applied to determine a deviation from stoichiometry y in the bulk and at the surface of TiO2−y layers. The critical review of these experimental methods is given. Defect structure responsible for the electrical resistivity of rutile TiO2 is discussed. |
url |
http://dx.doi.org/10.1155/2012/826873 |
work_keys_str_mv |
AT kzakrzewska nonstoichiometryintio2ystudiedbyionbeammethodsandphotoelectronspectroscopy |
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1725642851344187392 |