Reliability Analysis for Electronic Devices Using Generalized Exponential Distribution
Electronic devices are integral part of our life and modeling their lifetime is the most challenging and interesting field in reliability analysis. To investigate the failure behavior of electronic devices reliability analysis is commonly used. In the literature, however, it is reported that one in...
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2020-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/9110822/ |