General modeling on substrate curvatures and film stresses in bilayer systems
Based on the transform of reference plane of bending from substrate mid-plane to an optimum site, and synchronously involved with the hypothesis of a coupled lattice shared by atoms of two crystals on the both sides of interface between film and substrate, a new closed-form solution with symmetric f...
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| Format: | Article |
| Language: | English |
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AIP Publishing LLC
2019-05-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/1.5095551 |