General modeling on substrate curvatures and film stresses in bilayer systems

Based on the transform of reference plane of bending from substrate mid-plane to an optimum site, and synchronously involved with the hypothesis of a coupled lattice shared by atoms of two crystals on the both sides of interface between film and substrate, a new closed-form solution with symmetric f...

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Bibliographic Details
Main Author: Qingsong Mu
Format: Article
Language:English
Published: AIP Publishing LLC 2019-05-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/1.5095551