General modeling on substrate curvatures and film stresses in bilayer systems
Based on the transform of reference plane of bending from substrate mid-plane to an optimum site, and synchronously involved with the hypothesis of a coupled lattice shared by atoms of two crystals on the both sides of interface between film and substrate, a new closed-form solution with symmetric f...
Main Author: | |
---|---|
Format: | Article |
Language: | English |
Published: |
AIP Publishing LLC
2019-05-01
|
Series: | AIP Advances |
Online Access: | http://dx.doi.org/10.1063/1.5095551 |