Label-Free Imaging of Single Nanoparticles Using Total Internal Reflection-Based Leakage Radiation Microscopy

Label-Free Imaging of Single Nanoparticles Using Total Internal Reflection-Based Leakage Radiation Microscopy

Label-free, fast, and single nanoparticle detection is demanded for the in situ monitoring of nano-pollutants in the environment, which have potential toxic effects on human health. We present the label-free imaging of single nanoparticles by using total internal reflection (TIR)-based leakage radia...

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Bibliographic Details
Main Authors: Liwen Jiang, Xuqing Sun, Hongyao Liu, Ruxue Wei, Xue Wang, Chang Wang, Xinchao Lu, Chengjun Huang
Format: Article
Language:English
Published: MDPI AG 2020-03-01
Series:Nanomaterials
Subjects:
total internal reflection
evanescent waves
leakage radiation
nanoparticles
label-free imaging
microscopy
Online Access:https://www.mdpi.com/2079-4991/10/4/615

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https://www.mdpi.com/2079-4991/10/4/615

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