Application of X-ray topography to USSR and Russian space materials science

Application of X-ray topography to USSR and Russian space materials science

The authors' experience of the application of X-ray diffraction imaging in carrying out space technological experiments on semiconductor crystal growth for the former USSR and for Russia is reported, from the Apollo–Soyuz programme (1975) up to the present day. X-ray topography was applied to e...

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Bibliographic Details
Main Authors: I. L. Shul'pina, I. A. Prokhorov, Yu. A. Serebryakov, I. Zh. Bezbakh
Format: Article
Language:English
Published: International Union of Crystallography 2016-05-01
Series:IUCrJ
Subjects:
X-ray topography
space materials science
microgravity
semiconductor single crystals
growth striations
defects
physical modelling
thermogravitational convection
Online Access:http://scripts.iucr.org/cgi-bin/paper?S2052252516003730

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http://scripts.iucr.org/cgi-bin/paper?S2052252516003730

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