MEASUREMENTS OF STRAIN FIELDS DUE TO NANOSCALE PRECIPITATES USING THE PHASE IMAGE METHOD
Owing the phase image method (Hytch, 1998), strain fields can be derived from HREM images. The method is here applied to the nanoscale precipitates responsible for hardening in Aluminum alloys. Since the method is a very sensitive one, we have examined the impact of several aspects of the image qual...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Slovenian Society for Stereology and Quantitative Image Analysis
2011-05-01
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| Series: | Image Analysis and Stereology |
| Subjects: | |
| Online Access: | http://www.ias-iss.org/ojs/IAS/article/view/682 |