Electrochromic behavior of NiO film prepared by e-beam evaporation
The NiO thin films were prepared by the electron beam evaporation method using synthesized sintered targets. As-prepared films were characterized using X-ray diffraction, scanning electron microscopy, UV–VIS spectroscopy and cyclic voltammetry. The thicker films were found to exhibit a well-defined...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2017-06-01
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| Series: | Journal of Science: Advanced Materials and Devices |
| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S2468217916302040 |