Deep learning enables structured illumination microscopy with low light levels and enhanced speed
Super-resolution microscopy typically requires high laser powers which can induce photobleaching and degrade image quality. Here the authors augment structured illumination microscopy (SIM) with deep learning to reduce the number of raw images required and boost its performance under low light condi...
| Main Authors: | , , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Nature Publishing Group
2020-04-01
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| Series: | Nature Communications |
| Online Access: | https://doi.org/10.1038/s41467-020-15784-x |