Measurement of the Tunneling and Hopping Parameters in RuO2 Thick Films

Bibliographic Details
Main Authors: R. J. Snyder, N. C. Halder
Format: Article
Language:English
Published: Hindawi Limited 1984-01-01
Series:Active and Passive Electronic Components
Online Access:http://dx.doi.org/10.1155/APEC.11.123