Effect of thermal annealing on structural and optical properties of In doped Ge-Se-Te chalcogenide thin films
Thin films of Ge10–xSe60Te30Inx (x = 0, 2, 4 and 6) were developed by thermal evaporation technique. The annealing effect on the structural properties of Ge10–xSe60Te30Inx (x = 0, 2, 4 and 6) films has been studied by X-ray diffraction (XRD). The XRD results indicate amorphous nature of the as-prepa...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Sciendo
2019-12-01
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| Series: | Materials Science-Poland |
| Subjects: | |
| Online Access: | https://doi.org/10.2478/msp-2019-0061 |