Stress relaxation in pulsed DC electromigration measurements

Stress relaxation in pulsed DC electromigration measurements

When a high current density is applied to a conductor, it activates several driving forces for mass transport that can lead to device failure, the most prominent of which is electromigration. However, there are other driving forces operating as well that can counteract or add to the effects of elect...

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Main Authors: I. J. Ringler, J. R. Lloyd
Format: Article
Language:English
Published: AIP Publishing LLC 2016-09-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/1.4963669
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spelling doaj-c9fa05d56b0c445eb1e2958bb6a8a0fd2020-11-24T20:42:56ZengAIP Publishing LLCAIP Advances2158-32262016-09-0169095118095118-410.1063/1.4963669071609ADVStress relaxation in pulsed DC electromigration measurementsI. J. Ringler0J. R. Lloyd1SUNY Polytechnic Institute, Albany, New York 12203, USASUNY Polytechnic Institute, Albany, New York 12203, USAWhen a high current density is applied to a conductor, it activates several driving forces for mass transport that can lead to device failure, the most prominent of which is electromigration. However, there are other driving forces operating as well that can counteract or add to the effects of electromigration. A major driving force is a stress gradient that is developed as a response to electromigration in the presence of a blocking boundary condition. When the electrical stress is interrupted by pulsing DC measurements at low frequency, relaxation of the stress is observed through longer lifetime.http://dx.doi.org/10.1063/1.4963669
collection DOAJ
language English
format Article
sources DOAJ
author I. J. Ringler
J. R. Lloyd
spellingShingle I. J. Ringler
J. R. Lloyd
Stress relaxation in pulsed DC electromigration measurements
AIP Advances
author_facet I. J. Ringler
J. R. Lloyd
author_sort I. J. Ringler
title Stress relaxation in pulsed DC electromigration measurements
title_short Stress relaxation in pulsed DC electromigration measurements
title_full Stress relaxation in pulsed DC electromigration measurements
title_fullStr Stress relaxation in pulsed DC electromigration measurements
title_full_unstemmed Stress relaxation in pulsed DC electromigration measurements
title_sort stress relaxation in pulsed dc electromigration measurements
publisher AIP Publishing LLC
series AIP Advances
issn 2158-3226
publishDate 2016-09-01
description When a high current density is applied to a conductor, it activates several driving forces for mass transport that can lead to device failure, the most prominent of which is electromigration. However, there are other driving forces operating as well that can counteract or add to the effects of electromigration. A major driving force is a stress gradient that is developed as a response to electromigration in the presence of a blocking boundary condition. When the electrical stress is interrupted by pulsing DC measurements at low frequency, relaxation of the stress is observed through longer lifetime.
url http://dx.doi.org/10.1063/1.4963669
work_keys_str_mv AT ijringler stressrelaxationinpulseddcelectromigrationmeasurements
AT jrlloyd stressrelaxationinpulseddcelectromigrationmeasurements
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