Stress relaxation in pulsed DC electromigration measurements
When a high current density is applied to a conductor, it activates several driving forces for mass transport that can lead to device failure, the most prominent of which is electromigration. However, there are other driving forces operating as well that can counteract or add to the effects of elect...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2016-09-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/1.4963669 |