ARMScope – the versatile platform for scanning probe microscopy systems
Scanning probe microscopy (SPM) since its invention in the 80’s became very popular in examination of many different sample parameters, both in university and industry. This was the effect of bringing this technology closer to the operator. Although the ease of use opened a possibility for measureme...
| Main Authors: | , , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Polish Academy of Sciences
2020-03-01
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| Series: | Metrology and Measurement Systems |
| Subjects: | |
| Online Access: | http://journals.pan.pl/dlibra/publication/131711/edition/115042/content |