Estimation of steady-state leakage current in polycrystalline PZT thin films
Estimation of the steady state (or “true”) leakage current Js in polycrystalline ferroelectric PZT films with the use of the voltage-step technique is discussed. Curie-von Schweidler (CvS) and sum of exponents (Σexp) models are studied for current-time J (t) data fitting. Σexp model (sum of three or...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2016-09-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/1.4964147 |