High Resolution and Polarization Independent Microwave Near-Field Imaging Using Planar Resonator Probes

High Resolution and Polarization Independent Microwave Near-Field Imaging Using Planar Resonator Probes

Various near-field microwave imaging probes were developed previously for nondestructive testing of material structures. Sensitivity and resolution are key parameters for quantifying the efficacy of a given imaging probe. For polarized targets like cracks, the sensitivity of conventional aperture pr...

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Bibliographic Details
Main Authors: Andri Haryono, Khadeeja Aljaberi, Mohammed Saif Ur Rahman, Mohamed A. Abou-Khousa
Format: Article
Language:English
Published: IEEE 2020-01-01
Series:IEEE Access
Subjects:
Non-destructive testing
microwave imaging
planar probe
near-field
polarization
spiral resonator
Online Access:https://ieeexplore.ieee.org/document/9233426/

Internet

https://ieeexplore.ieee.org/document/9233426/

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