Nucleation Control in Physical Vapor Transport Growth of AlN Single Crystals on Polycrystal Tungsten Substrates

The improved resistively-heated furnace with two heaters established a vertical thermal gradient to control nucleation during AlN single crystals Physical Vapor Transport (PVT) growth on polycrystal tungsten substrates. During the high temperature (> 1850 °C) heating process, the reverse temperat...

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Main Authors: Honglei WU, Zuoyan QIN, Xueyong TIAN, Zhenhua SUN, Baikui LI, Ruisheng ZHENG, Ke WANG
Format: Article
Language:English
Published: Kaunas University of Technology 2019-12-01
Series:Medžiagotyra
Subjects:
Online Access:http://matsc.ktu.lt/index.php/MatSc/article/view/21575
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spelling doaj-c659b4f0a5904776a2d9dc614b1f7b972020-11-25T00:44:42ZengKaunas University of TechnologyMedžiagotyra1392-13202029-72892019-12-0126213914210.5755/j01.ms.26.2.2157521575Nucleation Control in Physical Vapor Transport Growth of AlN Single Crystals on Polycrystal Tungsten SubstratesHonglei WUZuoyan QINXueyong TIANZhenhua SUNBaikui LIRuisheng ZHENGKe WANGThe improved resistively-heated furnace with two heaters established a vertical thermal gradient to control nucleation during AlN single crystals Physical Vapor Transport (PVT) growth on polycrystal tungsten substrates. During the high temperature (> 1850 °C) heating process, the reverse temperature field (i.e., the temperature difference between the sublimation zone and the crystalline zone ΔT < 0) was obtained to reduce the number of nuclei on the tungsten substrate. During growth, the proper positive values of ΔT T were chosen to content the supersaturation values (0.25 < S < 0.3). The reverse temperature condition during high temperature (> 1850 °C) cooling was fulfilled to avoid recrystallization on grown AlN crystal. AlN single crystals made through the method were characterized by X-ray diffractions (XRD) and Raman spectroscopy.http://matsc.ktu.lt/index.php/MatSc/article/view/21575growth from vaporsingle-crystal growthnitridesx-ray diffraction
collection DOAJ
language English
format Article
sources DOAJ
author Honglei WU
Zuoyan QIN
Xueyong TIAN
Zhenhua SUN
Baikui LI
Ruisheng ZHENG
Ke WANG
spellingShingle Honglei WU
Zuoyan QIN
Xueyong TIAN
Zhenhua SUN
Baikui LI
Ruisheng ZHENG
Ke WANG
Nucleation Control in Physical Vapor Transport Growth of AlN Single Crystals on Polycrystal Tungsten Substrates
Medžiagotyra
growth from vapor
single-crystal growth
nitrides
x-ray diffraction
author_facet Honglei WU
Zuoyan QIN
Xueyong TIAN
Zhenhua SUN
Baikui LI
Ruisheng ZHENG
Ke WANG
author_sort Honglei WU
title Nucleation Control in Physical Vapor Transport Growth of AlN Single Crystals on Polycrystal Tungsten Substrates
title_short Nucleation Control in Physical Vapor Transport Growth of AlN Single Crystals on Polycrystal Tungsten Substrates
title_full Nucleation Control in Physical Vapor Transport Growth of AlN Single Crystals on Polycrystal Tungsten Substrates
title_fullStr Nucleation Control in Physical Vapor Transport Growth of AlN Single Crystals on Polycrystal Tungsten Substrates
title_full_unstemmed Nucleation Control in Physical Vapor Transport Growth of AlN Single Crystals on Polycrystal Tungsten Substrates
title_sort nucleation control in physical vapor transport growth of aln single crystals on polycrystal tungsten substrates
publisher Kaunas University of Technology
series Medžiagotyra
issn 1392-1320
2029-7289
publishDate 2019-12-01
description The improved resistively-heated furnace with two heaters established a vertical thermal gradient to control nucleation during AlN single crystals Physical Vapor Transport (PVT) growth on polycrystal tungsten substrates. During the high temperature (> 1850 °C) heating process, the reverse temperature field (i.e., the temperature difference between the sublimation zone and the crystalline zone ΔT < 0) was obtained to reduce the number of nuclei on the tungsten substrate. During growth, the proper positive values of ΔT T were chosen to content the supersaturation values (0.25 < S < 0.3). The reverse temperature condition during high temperature (> 1850 °C) cooling was fulfilled to avoid recrystallization on grown AlN crystal. AlN single crystals made through the method were characterized by X-ray diffractions (XRD) and Raman spectroscopy.
topic growth from vapor
single-crystal growth
nitrides
x-ray diffraction
url http://matsc.ktu.lt/index.php/MatSc/article/view/21575
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