Electrical Analogy to an Atomic Force Microscope
Several applications of the atomic force microscopy (AFM), such as measurement of soft samples, manipulation with molecules, etc., require mechanical analysis of the AFM probe behavior. In this article we suggest the electrical circuit analogy to AFM cantilever tip motion. Well developed circuit the...
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| Format: | Article |
| Language: | English |
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Spolecnost pro radioelektronicke inzenyrstvi
2010-04-01
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| Series: | Radioengineering |
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| Online Access: | http://www.radioeng.cz/fulltexts/2010/10_01_168_171.pdf |