TOPICAL REVIEW: Nanofabrication by advanced electron microscopy using intense and focused beam

TOPICAL REVIEW: Nanofabrication by advanced electron microscopy using intense and focused beam

The nanogrowth and nanofabrication of solid substances using an intense and focused electron beam are reviewed in terms of the application of scanning and transmission electron microscopy (SEM, TEM and STEM) to control the size, position and structure of nanomaterials. The first example discussed is...

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Bibliographic Details
Main Author: Kazuo Furuya
Format: Article
Language:English
Published: Taylor & Francis Group 2008-01-01
Series:Science and Technology of Advanced Materials
Subjects:
electron-beam-induced deposition
iron carbonyl
nanorod
electron holography
ultrahigh vacuum
Cs corrector
scanning transmission electron microscopy
Online Access:http://www.iop.org/EJ/abstract/1468-6996/9/1/014110

Internet

http://www.iop.org/EJ/abstract/1468-6996/9/1/014110

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