Blockchain Architecture Reliability-Based Measurement for Circuit Unit Importance

Currently, few works focus on the reliability of the blockchain architecture at the circuit level, which makes its security and privacy vulnerable to hardware errors. To mitigate the hazard, through an iterative probabilistic transfer matrix model coded by a binary-decimal mechanism, a reliability-b...

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Bibliographic Details
Main Authors: Jie Xiao, Jungang Lou, Jianhui Jiang, Xiaoxin Li, Xuhua Yang, Yujiao Huang
Format: Article
Language:English
Published: IEEE 2018-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/8287800/