X-Ray Topography of the Subsurface Crystal Layers in the Skew Asymmetric Reflection Geometry
The technique of X ray topography with the asymmetric reflection geometry of X-ray diffraction presented in this paper as useful tool for structural characterization of materials, particularly, epitaxial thin films and semiconductor multi-layered crystal systems used for the optoelectronic devices....
| Main Authors: | , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Polish Academy of Sciences
2016-12-01
|
| Series: | Archives of Metallurgy and Materials |
| Online Access: | http://www.degruyter.com/view/j/amm.2016.61.issue-4/amm-2016-0310/amm-2016-0310.xml?format=INT |