Structure analysis of Ni thin films epitaxially grown on bcc metal underlayers formed on MgO(100) substrates
Ni thin films are prepared on Cr, V, and Nb underlayers with bcc structure formed on MgO(100) single-crystal substrates by molecular beam epitaxy. The growth behavior and the crystallographic properties are investigated by in-situ reflection high-energy electron diffraction and pole-figure X-ray dif...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
EDP Sciences
2013-01-01
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| Series: | EPJ Web of Conferences |
| Online Access: | http://dx.doi.org/10.1051/epjconf/20134008004 |