Modeling of Static Negative Bias Temperature Stressing in p-channel VDMOSFETs using Least Square Method

Modeling of Static Negative Bias Temperature Stressing in p-channel VDMOSFETs using Least Square Method

Bibliographic Details
Main Authors:	N. Mitrović, D. Danković, B. Ranđelović, Z. Prijić, N. Stojadinović
Format:	Article
Language:	English
Published:	MIDEM Society - Society for Microelectronics, Electronic Components and Materials 2020-11-01
Series:	Informacije MIDEM
Subjects:	nbti vdmosfet electrical circuit modeling least square method
Online Access:	http://www.midem-drustvo.si/Journal%20papers/MIDEM_50(2020)3p205.pdf

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