Modeling of Static Negative Bias Temperature Stressing in p-channel VDMOSFETs using Least Square Method
| Main Authors: | , , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
MIDEM Society - Society for Microelectronics, Electronic Components and Materials
2020-11-01
|
| Series: | Informacije MIDEM |
| Subjects: | |
| Online Access: | http://www.midem-drustvo.si/Journal%20papers/MIDEM_50(2020)3p205.pdf |