Measurement of carrier lifetime in micron-scaled materials using resonant microwave circuits

Measurement of carrier lifetime in micron-scaled materials using resonant microwave circuits

A method for measuring carrier dynamics in micron-scale optoelectronic materials based on time-resolved microwave reflection is reported. Compared to a standard time-resolved photoluminescence approach, the authors show a 105 improvement in sensitivity when measuring lifetimes in a semiconductor pix...

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Bibliographic Details
Main Authors: Sukrith Dev, Yinan Wang, Kyounghwan Kim, Marziyeh Zamiri, Clark Kadlec, Michael Goldflam, Samuel Hawkins, Eric Shaner, Jin Kim, Sanjay Krishna, Monica Allen, Jeffery Allen, Emanuel Tutuc, Daniel Wasserman
Format: Article
Language:English
Published: Nature Publishing Group 2019-04-01
Series:Nature Communications
Online Access:https://doi.org/10.1038/s41467-019-09602-2

Internet

https://doi.org/10.1038/s41467-019-09602-2

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