Reliability prediction of RFID passive tags power supply systems based on RTD under given operating conditions

Reliability prediction of RFID passive tags power supply systems based on RTD under given operating conditions

The technique for predicting RFID passive tag power supply system reliability, the failure of which is caused by the degradation of RTDs that are part of the tag rectifier, is developed. The calculation of the time to failure of the RFID passive tag power supply system by the criterion of the minimu...

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Main Authors: Makeev Mstislav, Sinyakin Vladimir, Meshkov Sergey
Format: Article
Language:English
Published: EDP Sciences 2018-01-01
Series:MATEC Web of Conferences
Online Access:https://doi.org/10.1051/matecconf/201822402095
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spelling doaj-c12bd1937e7245b894586869e392d48e2021-03-02T09:53:30ZengEDP SciencesMATEC Web of Conferences2261-236X2018-01-012240209510.1051/matecconf/201822402095matecconf_icmtmte2018_02095Reliability prediction of RFID passive tags power supply systems based on RTD under given operating conditionsMakeev MstislavSinyakin Vladimir0Meshkov Sergey1Bauman Moscow State Technical UniversityBauman Moscow State Technical UniversityThe technique for predicting RFID passive tag power supply system reliability, the failure of which is caused by the degradation of RTDs that are part of the tag rectifier, is developed. The calculation of the time to failure of the RFID passive tag power supply system by the criterion of the minimum permissible range is presented based on the developed technique.https://doi.org/10.1051/matecconf/201822402095
collection DOAJ
language English
format Article
sources DOAJ
author Makeev Mstislav
Sinyakin Vladimir
Meshkov Sergey
spellingShingle Makeev Mstislav
Sinyakin Vladimir
Meshkov Sergey
Reliability prediction of RFID passive tags power supply systems based on RTD under given operating conditions
MATEC Web of Conferences
author_facet Makeev Mstislav
Sinyakin Vladimir
Meshkov Sergey
author_sort Makeev Mstislav
title Reliability prediction of RFID passive tags power supply systems based on RTD under given operating conditions
title_short Reliability prediction of RFID passive tags power supply systems based on RTD under given operating conditions
title_full Reliability prediction of RFID passive tags power supply systems based on RTD under given operating conditions
title_fullStr Reliability prediction of RFID passive tags power supply systems based on RTD under given operating conditions
title_full_unstemmed Reliability prediction of RFID passive tags power supply systems based on RTD under given operating conditions
title_sort reliability prediction of rfid passive tags power supply systems based on rtd under given operating conditions
publisher EDP Sciences
series MATEC Web of Conferences
issn 2261-236X
publishDate 2018-01-01
description The technique for predicting RFID passive tag power supply system reliability, the failure of which is caused by the degradation of RTDs that are part of the tag rectifier, is developed. The calculation of the time to failure of the RFID passive tag power supply system by the criterion of the minimum permissible range is presented based on the developed technique.
url https://doi.org/10.1051/matecconf/201822402095
work_keys_str_mv AT makeevmstislav reliabilitypredictionofrfidpassivetagspowersupplysystemsbasedonrtdundergivenoperatingconditions
AT sinyakinvladimir reliabilitypredictionofrfidpassivetagspowersupplysystemsbasedonrtdundergivenoperatingconditions
AT meshkovsergey reliabilitypredictionofrfidpassivetagspowersupplysystemsbasedonrtdundergivenoperatingconditions
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