Reliability prediction of RFID passive tags power supply systems based on RTD under given operating conditions
The technique for predicting RFID passive tag power supply system reliability, the failure of which is caused by the degradation of RTDs that are part of the tag rectifier, is developed. The calculation of the time to failure of the RFID passive tag power supply system by the criterion of the minimu...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
EDP Sciences
2018-01-01
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| Series: | MATEC Web of Conferences |
| Online Access: | https://doi.org/10.1051/matecconf/201822402095 |
| Summary: | The technique for predicting RFID passive tag power supply system reliability, the failure of which is caused by the degradation of RTDs that are part of the tag rectifier, is developed. The calculation of the time to failure of the RFID passive tag power supply system by the criterion of the minimum permissible range is presented based on the developed technique. |
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| ISSN: | 2261-236X |